Performance evaluation of an optoelectronic oscillator

摘要

Phase noise measurements of an optoelectronic oscillator (OEO) atnfrequencies less than 10 Ha from the carrier (10.6 GHz) as well as thenmeasured Allan variance are presented for the first time. The system hasna measured single-side-band (SSB) phase-noise of -123 dB/Hz at 10 kHznfrom the carrier and a Σy(Τ)=10-10 fornan integration time between 1 and 10 seconds. The importance ofnamplifier phase-noise and environmental fluctuations in determining thennoise of the oscillator at these low Fourier frequencies is verifiednexperimentally and analyzed using a generalized model of noise sourcesnin the OEOs. This analysis then allows prediction of the oscillatornperformance from measured parameters of individual components in thensystem