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Growth of AlN piezoelectric film on diamond for high-frequency surface acoustic wave devices

机译:用于高频表面声波器件的金刚石上AlN压电膜的生长

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Diamond films are very desirable for application to SAW devices because of their high acoustic wave velocity, which allows the extending of the frequency limit of operation at a given interdigital transducer line-width resolution. Use of high-quality AlN as the piezoelectric layer in conjunction with diamond is also desirable because of its high SAW velocity - the highest among all piezoelectric materials - together with its excellent electrical, mechanical, and chemical properties. The problems arising in the growth of AlN films on diamond have prevented, until now, the use of this combination of materials. In this paper we present recent results on the growth of highly oriented, low-stressed AlN films on diamond. SAW propagation on AlN/diamond has been theoretically investigated together with electromechanical coupling for both the Rayleigh and the Sezawa modes. The theoretical calculations show that high SAW velocities are achievable with good coupling efficiencies. Under proper conditions very large piezoelectric couplings are predicted k/sup 2/ = 2.2 and 4% for the Rayleigh and the Sezawa wave, respectively comparable to those observed in strongly piezoelectric single crystals such as LiNbO/sub 3/, but with SAW velocities approximately two-fold higher. Experiments performed on AIN/diamond/Si SAW test devices have shown good agreement between experimental results and theoretical predictions and demonstrate the feasibility of SAW devices based on this technology.
机译:金刚石膜由于其高声波速度而非常希望用于SAW器件,这允许在给定的叉指换能器线宽分辨率下扩展操作的频率极限。还希望使用高质量的AlN作为金刚石的压电层,因为它具有很高的SAW速度(在所有压电材料中是最高的)以及出色的电,机械和化学性能。迄今为止,在金刚石上生长AlN膜时出现的问题一直阻止了这种材料组合的使用。在本文中,我们介绍了在金刚石上生长高取向,低应力AlN膜的最新结果。理论上已经研究了在AlN /金刚石上的SAW传播以及瑞利和Sezawa模式的机电耦合。理论计算表明,可以实现高声表面波速度并具有良好的耦合效率。在适当条件下,瑞利波和塞泽瓦波的非常大的压电耦合预计为k / sup 2 / = 2.2和4%,分别与在强压电单晶体(如LiNbO / sub 3 /)中观察到的相当,但SAW速度约为高两倍。在AIN /金刚石/ Si声表面波测试设备上进行的实验表明,实验结果与理论预测之间具有很好的一致性,并证明了基于此技术的声表面波设备的可行性。

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