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首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Room temperature measurement of the anisotropic loss tangent of sapphire using the whispering gallery mode technique
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Room temperature measurement of the anisotropic loss tangent of sapphire using the whispering gallery mode technique

机译:使用回音壁模式技术在室温下测量蓝宝石的各向异性损耗正切

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摘要

The anisotropic loss tangent has been determined in monocrystalline sapphire for components parallel and perpendicular to the crystal axis, using the whispering gallery (WG) mode method. The Q-factors of quasi-TE and quasi-TM modes were measured precisely in four cylindrical sapphire resonators at room temperature, from which was determined a maximum attainable Q-factor of (2.1 /spl plusmn/ 0.2) /spl times/ 10/sup 5/ at 9 GHz in a quasi-TM mode. Sapphire dielectric material from three different manufacturers was compared over the 270-345 K temperature range and the 5-16 GHz frequency range.
机译:已经使用耳语画廊(WG)模式方法在单晶蓝宝石中确定了与晶体轴平行和垂直的组分的各向异性损耗正切。在室温下,在四个圆柱形蓝宝石谐振器中精确测量了准TE模式和准TM模式的Q因子,从中确定最大可达到的Q因子为(2.1 / spl plusmn / 0.2)/ spl times / 10 /在准TM模式下为9 GHz时的sup 5 /。在270-345 K的温度范围和5-16 GHz的频率范围内比较了来自三个不同制造商的蓝宝石电介质材料。

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