Electron Backscatter Diffraction as a Domain Analysis Technique in BiFeO/sub 3/-PbTiO/sub 3/Single Crystals

Burnett T.L.; Comyn T.P.; Merson E.; Bell A.J.; Mingard K.; Hegarty T.; Cain M.

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Electron Backscatter Diffraction as a Domain Analysis Technique in BiFeO/sub 3/-PbTiO/sub 3/Single Crystals

机译：电子背散射衍射作为BiFeO / sub 3 / -PbTiO / sub 3 /单晶中的畴分析技术

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xBiFeO3-(1-x)PbTiO3 single crystals were grown via a flux method for a range of compositions. Presented here is a study of the domain configuration in the 0.5BiFeO3-0.5PbTiO3 composition using electron backscatt

机译：通过助熔剂方法生长了xBiFeO3-（1-x）PbTiO3单晶，形成了一系列组成。本文介绍的是利用电子背向散射研究0.5BiFeO3-0.5PbTiO3成分的畴构型

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《IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control》 |2008年第5期|p.957-962|共6页
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Burnett T.L.; Comyn T.P.; Merson E.; Bell A.J.; Mingard K.; Hegarty T.; Cain M.;
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正文语种 eng
中图分类声学工程;计量学;
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Electron Backscatter Diffraction as a Domain Analysis Technique in BiFeO/sub 3/-PbTiO/sub 3/Single Crystals

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