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首页> 外文期刊>Ultrasonics, Ferroelectrics and Frequency Control, IEEE Transactions on >Development of dual PZT transducers for reference-free crack detection in thin plate structures
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Development of dual PZT transducers for reference-free crack detection in thin plate structures

机译:开发用于薄板结构中无参考裂纹检测的双PZT传感器

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摘要

A new Lamb-wave-based nondestructive testing (NDT) technique, which does not rely on previously stored baseline data, is developed for crack monitoring in plate structures. Commonly, the presence of damage is identified by comparing "current data" measured from a potentially damaged stage of a structure with "baseline data" previously obtained at the intact condition of the structure. In practice, structural defects typically take place long after collection of the baseline data, and the baseline data can be also affected by external loading, temperature variations, and changing boundary conditions. To eliminate the dependence on the baseline data comparison, the authors previously developed a reference-free NDT technique using 2 pairs of collocated lead zirconate titanate (PZT) transducers placed on both sides of a plate. This reference-free technique is further advanced in the present study by the necessity of attaching transducers only on a single surface of a structure for certain applications such as aircraft. To achieve this goal, a new design of PZT transducers called dual PZT transducers is proposed. Crack formation creates Lamb wave mode conversion due to a sudden thickness change of the structure. This crack appearance is instantly detected from the measured Lamb wave signals using the dual PZT transducers. This study also suggests a reference-free statistical approach that enables damage classification using only the currently measured data set. Numerical simulations and experiments were conducted using an aluminum plate with uniform thickness and fundamental Lamb waves modes to demonstrate the applicability of the proposed technique to reference-free crack detection.
机译:一种新的基于Lamb-wave的无损检测(NDT)技术,该技术不依赖于先前存储的基准数据,用于板结构中的裂缝监控。通常,通过将从结构的潜在损坏阶段测得的“当前数据”与先前在结构完好状态下获得的“基准数据”进行比较,来确定是否存在损坏。实际上,结构缺陷通常会在收集基线数据后很长时间发生,并且基线数据还会受到外部负载,温度变化和边界条件变化的影响。为了消除对基准数据比较的依赖,作者先前开发了一种无参考NDT技术,该技术使用两对并排放置在平板上的钛酸锆钛酸铅(PZT)传感器。对于某些应用(例如飞机),仅在结构的单个表面上附加换能器的必要性,这项无参考技术在本研究中得到了进一步的发展。为了实现此目标,提出了一种新的PZT换能器设计,称为双PZT换能器。由于结构的突然厚度变化,裂纹形成会产生兰姆波模式转换。使用双PZT换能器从测量的兰姆波信号中立即检测出这种裂纹外观。这项研究还提出了一种无参考的统计方法,该方法仅使用当前测量的数据集即可进行损坏分类。使用具有均匀厚度和基本Lamb波模式的铝板进行了数值模拟和实验,以证明该技术在无参考裂纹检测中的适用性。

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