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首页> 外文期刊>Ultrasonics, Ferroelectrics and Frequency Control, IEEE Transactions on >Suppression of Transverse-Mode Spurious Responses for SAW Resonators on SiO2/Al/LiNbO3 Structure by Selective Removal of SiO2
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Suppression of Transverse-Mode Spurious Responses for SAW Resonators on SiO2/Al/LiNbO3 Structure by Selective Removal of SiO2

机译:通过选择性去除SiO2抑制SiO2 / Al / LiNbO3结构上SAW谐振器的横模寄生响应

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摘要

A SiO2/Al/LiNbO3 structure has a large electromechanical coupling factor (K2) and good temperature coefficient of frequency (TCF) for applications as a SAW duplexer of the Universal Mobile Telecommunications System (UMTS) Band I. However, the SiO2/Al/LiNbO3 structure also supports two unwanted spurious responses; one is caused by the Rayleigh mode and the other by the transverse mode. As the authors have previously discussed, the Rayleigh-mode spurious response can be suppressed by controlling the cross-sectional shape of a SiO2 overlay deposited on resonator electrodes. In this paper, a new technique to suppress the transverse-mode spurious responses is proposed. In the technique, the SiO2 overlay is selectively removed from the dummy electrode region. The spurious responses are analyzed by the laser probe system. The results indicate that the spurious responses in question were hybrid modes caused by the coupling between the main (SH) SAW and another (Rayleigh) SAW with different velocities. The hybrid-mode spurious behavior was dependent on the velocities in the IDT and the dummy regions (vi and vd). The hybrid-mode spurious responses could be suppressed by selectively removing SiO2. Furthermore, the SAW energy confinement could be enhanced in the IDT electrode region when vi < vd. The transverse-mode spurious responses were successfully suppressed without degrading the SAW resonator performances
机译:SiO2 / Al / LiNbO3结构具有较大的机电耦合系数(K2)和良好的频率温度系数(TCF),可用作通用移动电信系统(UMTS)频段I的SAW双工器。但是,SiO2 / Al / LiNbO3结构还支持两种不希望的杂散响应。一种是由瑞利模式引起的,另一种是由横向模式引起的。正如作者先前讨论的那样,可以通过控制沉积在谐振器电极上的SiO2覆盖层的横截面形状来抑制瑞利模式杂散响应。本文提出了一种抑制横模寄生响应的新技术。在该技术中,从虚设电极区域选择性地去除SiO 2覆盖层。寄生响应由激光探针系统分析。结果表明,所讨论的寄生响应是混合模式,这是由主(SH)声表面波和另一声(瑞利)声表面波之间的耦合引起的。混合模式的杂散行为取决于IDT和虚拟区域(vi和vd)中的速度。可以通过选择性去除SiO2来抑制混合模式的寄生响应。此外,当vi

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