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The Instability of Angstrom-Scale Head-Disk Interface Induced by Electrostatic Force

机译:静电力引起的埃级磁头-磁盘界面的不稳定性

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When the storage density is several Tb/in, the head–disk spacing will drop into an angstrom-scale regime. At such small clearance, the electrostatic force (EF) becomes increasingly significant. However, the electrostatic-induced head–disk interface (HDI) instability and the relevant reliability were not well addressed in the past. Therefore, this paper investigates the instability of angstrom-scale HDI induced by the EF. First, the hysteresis effect of the touchdown-takeoff was investigated with/without eliminating the surface potential difference. The electrical powers of thermal flying-height control head were supplied and then released to capture the hysteresis effect. It is found that a significant improvement of the hysteresis effect has been achieved when the electrostatic potential was eliminated. Second, a wear test for over 60 h was performed when the head–disk clearance was set at an angstrom scale. It is also found that the wear robustness has been greatly improved by eliminating the electrostatic potential. This study will help the design of the head–disk system for better reliability, especially for wear and flying stability.
机译:当存储密度为几Tb / in时,磁头-磁盘间距将降至埃级。在这样小的间隙下,静电力(EF)变得越来越重要。但是,过去没有很好地解决静电诱发的磁头-磁盘接口(HDI)的不稳定性和相关的可靠性。因此,本文研究了由EF引起的埃尺度HDI的不稳定性。首先,研究了在有/没有消除表面电势差的情况下,着陆起飞的磁滞效应。热飞行高度控制头的电源已提供,然后释放以捕获磁滞效应。发现当消除静电势时已经实现了磁滞效应的显着改善。其次,当磁头-磁盘间隙设定为埃时,进行了超过60小时的磨损测试。还发现,通过消除静电势,大大提高了耐磨性。这项研究将有助于磁头磁盘系统的设计,以获得更好的可靠性,尤其是在磨损和飞行稳定性方面。

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