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首页> 外文期刊>Journal of Crystallization Process and Technology >Dielectric and Optical Characterization of Boron Doped Ammonium Dihydrogen Phosphate
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Dielectric and Optical Characterization of Boron Doped Ammonium Dihydrogen Phosphate

机译:硼掺杂磷酸二氢铵的介电和光学表征

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Single crystals of pure and boron doped ammonium dihydrogen phosphate were grown from aqueous solution by slow solvent evaporation process. ICP studies were done to confirm the presence of the dopant boron in the parent crystal. The values of the lattice parameters were determined by single crystal X-ray diffraction. The pure and doped ADP crystals were found to have tetragonal structure. Complete optical characterizations of the crystals were done using the FTIR, UV-Vis and NLO studies. The presences of the various functional groups in the crystals were identified by FTIR spectrum. The band gap energies of the pure and doped crystals have been calculated at their cut off frequencies using the UV-Vis spectrum. The second harmonic generation efficiency of the crystals was determined. The electric properties of the grown crystal have been analyzed by studying the variation of dielectric constant and dielectric loss with frequency.
机译:通过缓慢的溶剂蒸发过程从水溶液中生长出纯净的硼掺杂的磷酸二氢铵铵和单晶。进行了ICP研究以确认母体晶体中存在掺杂剂硼。晶格参数的值通过单晶X射线衍射确定。发现纯的和掺杂的ADP晶体具有四方结构。使用FTIR,UV-Vis和NLO研究完成了晶体的完整光学表征。通过FTIR光谱鉴定晶体中各种官能团的存在。已使用UV-Vis光谱在纯净和掺杂晶体的截止频率处计算出它们的带隙能。确定了晶体的二次谐波产生效率。通过研究介电常数和介电损耗随频率的变化,分析了生长晶体的电性能。

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