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首页> 外文期刊>Conference Papers in Science >Possibility to Use Low Temperature Pulsed RF Sputtered Indium Tin Oxide for the Fabrication of Organic Solar Cell
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Possibility to Use Low Temperature Pulsed RF Sputtered Indium Tin Oxide for the Fabrication of Organic Solar Cell

机译:使用低温脉冲射频溅射铟锡氧化物制造有机太阳能电池的可能性

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In this work we have used pulsed RF sputtering method to deposit indium tin oxide (ITO) for the fabrication of P3HT:PCBM based bulk heterojunction polymer solar cell. We have deposited ITO at low substrate temperature (100°C) and for different pulse modes. Oxygen was used as an admixture to the sputtering gas argon, and the percentage was varied from 0 to 6%. During deposition, plasma was studied by optical emission spectroscopy (OES) method. For our present range of deposition conditions lowest resistivity of ITO is around 2 × 10−4 Ω-cm, and it is deposited in High-Low mode with 1% of oxygen added to argon. The effect of oxygen admixture on electrical and optical properties of ITO thin films has been studied for different pulse modes. ITO films have been optimised by measuring their resistivity, transparency, and X-ray diffraction. Finally we have applied the ITO film for the fabrication of P3HT:PCBM based solar cell.
机译:在这项工作中,我们已使用脉冲RF溅射方法沉积铟锡氧化物(ITO),用于制造基于P3HT:PCBM的体异质结聚合物太阳能电池。我们已经在较低的基板温度(100°C)和不同的脉冲模式下沉积了ITO。使用氧气作为溅射氩气的混合物,其百分比在0到6%之间变化。在沉积过程中,通过光发射光谱法(OES)研究了等离子体。在我们目前的沉积条件范围内,ITO的最低电阻率约为2×10−4-Ω-cm,并且它以高-低模式沉积,并向氩气中添加了1%的氧气。对于不同的脉冲模式,已经研究了氧气混合物对ITO薄膜的电学和光学性质的影响。 ITO膜已通过测量其电阻率,透明度和X射线衍射进行了优化。最后,我们将ITO膜应用于制造基于P3HT:PCBM的太阳能电池。

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