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首页> 外文期刊>Applied Physics Letters >Accurate formula for dissipative interaction in frequency modulation atomic force microscopy
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Accurate formula for dissipative interaction in frequency modulation atomic force microscopy

机译:调频原子力显微镜中耗散相互作用的精确公式

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摘要

Much interest has recently focused on the viscosity of nano-confined liquids. Frequency modulation atomic force microscopy (FM-AFM) is a powerful technique that can detect variations in the conservative and dissipative forces between a nanometer-scale tip and a sample surface. We now present an accurate formula to convert the dissipation power of the cantilever measured during the experiment to damping of the tip-sample system. We demonstrated the conversion of the dissipation power versus tip-sample separation curve measured using a colloidal probe cantilever on a mica surface in water to the damping curve, which showed a good agreement with the theoretical curve. Moreover, we obtained the damping curve from the dissipation power curve measured on the hydration layers on the mica surface using a nanometer-scale tip, demonstrating that the formula allows us to quantitatively measure the viscosity of a nano-confined liquid using FM-AFM.
机译:最近,人们非常关注纳米受限液体的粘度。调频原子力显微镜(FM-AFM)是一项功能强大的技术,可以检测纳米级针尖和样品表面之间的保守力和耗散力的变化。现在,我们提出了一个精确的公式,可以将实验过程中测得的悬臂的耗散功率转换为尖端样品系统的阻尼。我们证明了使用胶体探针悬臂在水中的云母表面上测得的耗散功率与针尖样品分离曲线的转换为阻尼曲线,这与理论曲线非常吻合。此外,我们从使用纳米级尖端在云母表面水合层上测得的耗散功率曲线获得了阻尼曲线,表明该公式允许我们使用FM-AFM定量测量纳米受限液体的粘度。

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