Light Scattering from Rough Silver Surfaces: Modeling of Absorption Loss Measurements

摘要

We consider two series of experimental setups of multilayered Ag/ZnO thin films with varying surface morphologies given by atomic force microscopy images. The absorption loss under diffuse scattering is studied theoretically by applying a combination of the scattering matrix approach with diffraction theory for randomly nanotextured interfaces. Our modeling is in excellent agreement with the respective measurements. The theoretical approach is applicable to a wide range of wavelengths, surface morphologies, and materials for both measured and computed rough surface morphologies.