参加第49届丹佛X射线年会有感

摘要

报道了第49届丹佛X射线年会的概况。会议期间，关于微束装置及其分析技术、全反射技术与应用、探测器研制、薄层分析、样品制备、半导体材料分析等，受到广泛关注。%The 49th Denver Annual X-ray Conference is overviewed in this paper. The attention of the conference is paid to the trends and developments in micro-beam techniques, total reflection X-ray fluorescence analysis, new X-ray detector developments, film and coat analysis, sample preparation techniques and semi-conductor material analysis, etc.