首页> 中文期刊> 《光学精密工程》 >Development of Debris-free Laser Plasma Sources for EUV Lithography in CIOMP

Development of Debris-free Laser Plasma Sources for EUV Lithography in CIOMP

         

摘要

We have been developing debris-free laser plasma sources for EUV lithography since 1996. Two types of debris-free sources, such as cryogenic target and gas-puff target laser plasma sources, were designed and built up in CIOMP. EUV radiation spectra of the sources with a variety of targets have been obtained by different ways.

著录项

  • 来源
    《光学精密工程》 |2001年第5期|442-445|共4页
  • 作者

  • 作者单位

    State Key Laboratory of Applied Optics,Changchun Institute of Optics,rnFine Mechanics and Physics,Chinese Academy of Sciences,;

    State Key Laboratory of Applied Optics,Changchun Institute of Optics,rnFine Mechanics and Physics,Chinese Academy of Sciences,;

    State Key Laboratory of Applied Optics,Changchun Institute of Optics,rnFine Mechanics and Physics,Chinese Academy of Sciences,;

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  • 中图分类 光刻、掩膜;
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