短波长X射线衍射法测试纳米铝块体的内部残余应力

摘要

利用自主研发的 SWXRD-1000型短波长 X射线衍射仪对去应力热处理前后纳米铝块体的内部残余应力进行了测试；为研究残余应力沿试样厚度方向的分布,采用 Xstress-3000型 X射线应力仪对未热处理的纳米铝块体表面残余应力进行了测试。结果表明：纳米铝块体内部的晶粒取向分布均匀；随着热处理温度升高,块体中心处的残余应力呈下降的趋势,中心处的径向残余应力由未热处理时的113 MPa降至4 MPa,切向残余应力由未热处理时的91 MPa降至38 MPa；未热处理试样厚度方向上的残余应力分布整体呈为外压内拉,直径方向上的内部残余应力呈现出中间高两侧低的分布趋势,且中心附近为残余拉应力。%A self-developed SWXRD-1000 short-wavelength X-ray diffractometer was used to measure interior residual stress of bulk nanocrystalline aluminum before and after different stress-relief heat treatment;In order to study the distribution of residual stress along thickness direction, surface residual stress of bulk nanocrystalline aluminum before heat treatment was measured by Xstress-3000 stress diffractometer.The results show that grain orientation distribution inside nanocrystalline aluminum was uniform.The interior residual stress in sample center decreased with the increase of heat treatment temperature,and the radial residual stress in sample center decreased from 1 1 3 MPa(before heat treatment)to 4 MPa,and the tangential residual stress in sample center decreased from 91 MPa (before heat treatment)to 38 MPa.For the sample before heat treatment,the distribution of residual stress along thickness direction showed external compressive stress and interior tensile stress,and the higher interior residual stress along diameter direction located in center position,and the lower interior residual stress located in the two sides,and the stress near center position was compressive residual stress.