红外焦平面阵列盲元判据的相关性研究

摘要

Defective elements in infrared focal plane array (IRFPA)degrade the quality of infrared images and system performance. In the final tests in factory, defective elements are determined by three criterions: responsivity criterion, noise criterion and DC level criterion. Relations of the three criterions are analyzed in this paper. Defective elements with lower output DC level have the characteristics of higher noise and lower responsivity. Defective elements with higher output DC level have the characteristics of lower noise and lower responsivity. Test results show a good statistical accuracy,which validated the analyzing conclusions. Offset criterion can be used to determinate types and formation reasons of defective elements in IRFPA. Meanwhile, results of responsivity and noise criterion can also be deduced through offset criterion. In manufacture, waster is eliminated with this simple criterion in forepart. In application, the change of detectors can be evaluated and the new defect elements can be analyzed with this criterion. This provides an intuitionistic,fast and convenient way to evaluate defective elements in IRFPA.%红外系统中探测器盲元的存在降低了红外图像的质量和红外系统的性能.在红外焦平面阵列最终性能的测试评价中,盲元的判定主要有响应率判据、噪声判据和直流电平判据三种.本文研究了直流电平判据同其他两种盲元判据之间的关系:电平低于正常像元的盲元具有噪声高、响应低的特征；电平高于正常像元的盲元具有噪声低、响应低的特征.实际测试的数据验证了分析的结果,具有较高的判别准确率.电平判据在实现判别盲元的成因与类型的同时,亦可以推断出像元噪声和响应率的状态以及这两种判据的判别结果.在探测器的制造过程中,简单的判别准则有助于早期剔除不合格品；在系统应用中,可快速评估探测器的变化以及新增盲元的原因和特征.