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A Method on Analog Circuit Fault Diagnosis with Tolerance

         

摘要

In this paper, it is proved that the direction of the node-voltage difference vector, which is the difference between the node-voltage vector at faulty state and the one at the nominal state, is determined only by the location of the faulty element in linearanalog circuits. Considering that the direction of the node-voltage sensitivity vector is the same as the one of the node-voltage difference vector and also considering that the module of the node-voltage sensitivity vector presents the weight of the parameter of faulty element deviation relative to the voltage difference, faultdictionary is set up based on node-voltage sensitivity vectors. A decision algorithm is proposed concerned with both the location and the parameter difference of the faulty element. Single fault and multi-fault can be diagnosed while the circuit parameters deviate within the tolerance range of 10 %.

著录项

  • 来源
    《电子科技学刊》 |2009年第4期|297-302|共6页
  • 作者

    Ruey-Wen Liu;

  • 作者单位

    Department of Electrical Engineering;

    University of Notre Dame;

  • 原文格式 PDF
  • 正文语种 chi
  • 中图分类 电子电路;
  • 关键词

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