铌酸锂调制器加速贮存寿命评估

摘要

Objective To study the evaluation method for accelerated storage Life of FOG. Methods Based on Weibull distribution, employing the accelerated aging life evaluating test theory and technique, this paper proposed a theoretical model for constant stress accelerated aging life evaluation. Then it evaluated the storage reliability and storage life of integration optical modulator under different temperature stress, and analyzed the failure probability of the device in different time periods. Results It was calculated that the M shape parameter of Weibull distribution device was 0.314, which showed that the modulator storage was dominated by early-satge failure. Conclusion By the analysis of failure data of modulator, the Arrhenius accelerating model was determined, and the activation energy was calculated to be 1.1eV. In the environmental condition of 25℃, the reliability of 1-year storage of LiNbO3 modulator was 0.9454.%目的：研究铌酸锂调制器加速储存寿命的评估方法。方法基于韦布尔分布的方法，应用加速老化寿命评估试验理论和技术，建立恒加速应力老化寿命评估的理论模型。对集成光学调制器在不同温度应力下的加速贮存寿命进行统计，分析不同时间段器件失效概率，对其可靠性进行评估。结果计算出了器件韦布尔分布的形状参数m为0.314，表明调制器贮存时早期失效多。结论通过对器件失效数据进行分析，确定了阿伦尼斯加速模型，并计算其激活能为1.1 eV，分析得到在25℃环境条件下LiNbO3调制器器件贮存1年的可靠度为0.9454。