首页> 中文期刊> 《中国物理:英文版》 >Variable angle spectroscopic ellipsometry and its applications in determining optical constants of chalcogenide glasses in infrared

Variable angle spectroscopic ellipsometry and its applications in determining optical constants of chalcogenide glasses in infrared

         

摘要

The principle of variable angle spectroscopic ellipsometry (VASE) and the data analysis models,as well as the applications of VASE in the characterization of chalcogenide bulk glasses and thin films are reviewed.By going through the literature and summarizing the application scopes of various analysis models,it is found that a combination of various models,rather than any single data analysis model,is ideal to characterize the optical constants of the chalcogenide bulk glasses and thin films over a wider wavelength range.While the reliable optical data in the mid-and far-infrared region are limited,the VASE is flexible and reliable to solve the issues,making it promising to characterize the optical properties of chalcogenide glasses.

著录项

  • 来源
    《中国物理:英文版》 |2018年第6期|452-458|共7页
  • 作者单位

    Laboratory of Infrared Material and Devices, Advanced Technology Research Institute, Ningbo University, Ningbo 315211, China;

    Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China;

    Laboratory of Infrared Material and Devices, Advanced Technology Research Institute, Ningbo University, Ningbo 315211, China;

    Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China;

    Laboratory of Infrared Material and Devices, Advanced Technology Research Institute, Ningbo University, Ningbo 315211, China;

    Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China;

    Laboratory of Infrared Material and Devices, Advanced Technology Research Institute, Ningbo University, Ningbo 315211, China;

    Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China;

    Laboratory of Infrared Material and Devices, Advanced Technology Research Institute, Ningbo University, Ningbo 315211, China;

    Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China;

    Laboratory of Infrared Material and Devices, Advanced Technology Research Institute, Ningbo University, Ningbo 315211, China;

    Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China;

    Laboratory of Infrared Material and Devices, Advanced Technology Research Institute, Ningbo University, Ningbo 315211, China;

    Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China;

    Laboratory of Infrared Material and Devices, Advanced Technology Research Institute, Ningbo University, Ningbo 315211, China;

    Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China;

    Laboratory of Infrared Material and Devices, Advanced Technology Research Institute, Ningbo University, Ningbo 315211, China;

    Key Laboratory of Photoelectric Materials and Devices of Zhejiang Province, Ningbo 315211, China;

  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号