高精度实时主动轴向防漂移系统研究∗

摘要

基于单分子定位的荧光纳米分辨显微成像中，系统漂移会使得单分子定位出现额外偏差，从而使重构图像的分辨率降低，造成图像模糊.因此，对系统漂移量的控制至关重要.近年来，防漂移的方法层出不穷.本文针对其中一种利用光学测量原理和引入负反馈的防漂移方法做了系统的研究，分析了其原理和实现过程，对整个系统进行了误差分析，通过实验标定了整个防漂移系统的精度.该系统可以主动实时地校正漂移量，实现了显微镜轴向9.93 nm的防漂移精度.与现有商用的显微镜自带的防漂移装置相比，防漂移精度提高了一个量级.%In a fluorescent nano-resolution microscope based on single molecular localization, drift of focal plane will bring an additional deviation to the accuracy of single molecular localization. Consequently, this will reduce the final resolution of the reconstructed image and cause image degradation. Therefore, it is vital to control the system drift to a minimum level as much as possible. In recent years, the anti-drift ways emerged in endlessly. In this paper we made a systematic study aiming at the method in which optical measurement and negative feedback control are used. The basic principle and its implementation of the system are analyzed, and possible error is also evaluated. Finally, the precision of the system is tested experimentally. With this device, axial drift can be detected and corrected automatically in time, and the axial anti-drift accuracy as high as 9.93 nm can be achieved, which is one order higher than that of the existing commercial microscopies.