Dislocation emission from the crack tip in copper under mode Ⅱloading is simu1ated with molecular dynamics method. After 26 partial dislocationsare emitted and then relaxed to reach the equilibrium under the constant displace-ment, the double pile-ups (including an inverse pile-up and a pile-up) are formed.i.e., the first dislocation is piled up before the obstruction, and the last dislocation ispiled up ahead of the crack tip. These results conform to the TEM observations.
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