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Design and Fabrication of High Voltage Silicon Carbide Symmetric Blocking Switch for FREEDM Smart Grid.

机译:FREEDM智能电网的高压碳化硅对称阻塞开关的设计与制造。

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摘要

This research focuses on the development of symmetric blocking Silicon Carbide (SiC) power device for fault interruption devices (FID) of FREEDM smart grid. The high voltage SiC symmetric blocking bipolar switches can greatly simplify the power circuits and provide low forward voltages.;One of the most challenging aspects in developing a symmetric blocking device is to design an feasible edge termination technique for the SiC material. The Orthogonal Positive Bevel (OPB) termination formed by blade sawing was proposed to overcome all the fabrication difficulties in SiC processing. This concept has been experimentally verified by the fabrication of a 1kV symmetric blocking NPN structure that used conventional single-zone junction termination extension (JTE) for forward blocking and the OPB termination for reverse blocking.;As the power switches in the FID may need to withstand the short-circuit current for tens of microseconds, their current saturation capabilities are very important. In order to understand the limitations of SiC devices at short-circuit operation, the short-circuit behaviors of commercial 1200V class SiC MOSFET and normally-off SiC JFET have been studied and analyzed. It was found that the JFET gate structure is much more robust and more suitable for FID application due to preferably needed current saturation capability.;A 10kV Symmetric Blocking Field Controlled Diode has been designed using parameters based on the available 150mum P-epi wafer with TCAD tools. A novel buried 3-zone JTE was designed for forward blocking and the OPB termination for reverse blocking.
机译:这项研究的重点是开发用于FREEDM智能电网的故障中断设备(FID)的对称阻塞碳化硅(SiC)功率设备。高压SiC对称阻挡双极型开关可以大大简化电源电路并提供低正向电压。开发对称阻挡器件中最具挑战性的方面之一是为SiC材料设计可行的边缘终止技术。提出了通过刀片锯切形成的正交正斜面(OPB)终端,以克服SiC处理中的所有制造困难。该概念已通过制造1kV对称阻塞NPN结构进行了实验验证,该结构使用常规的单区结端接扩展(JTE)进行正向阻塞,并使用OPB端接进行反向阻塞。;由于FID中的电源开关可能需要承受数十微秒的短路电流,它们的电流饱和能力非常重要。为了了解SiC器件在短路操作时的局限性,对商用1200V级SiC MOSFET和常关型SiC JFET的短路行为进行了研究和分析。已发现,由于最好具有所需的电流饱和能力,JFET栅极结构更坚固耐用,更适合FID应用。;基于基于150微米P-epi晶圆和TCAD的参数,设计了一个10kV对称阻塞场控制二极管工具。一种新颖的掩埋3区JTE设计用于正向阻塞,而OPB端接则用于反向阻塞。

著录项

  • 作者

    Huang, Xing.;

  • 作者单位

    North Carolina State University.;

  • 授予单位 North Carolina State University.;
  • 学科 Electrical engineering.
  • 学位 Ph.D.
  • 年度 2014
  • 页码 152 p.
  • 总页数 152
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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