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Additive pattern transfer techniques for the post-IC integration of metallic MEMS onto active circuits.

机译:用于将金属MEMS进行IC后集成到有源电路的附加图案转移技术。

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摘要

Integration of MEMS onto microelectronics is of great interest in the MEMS research community because it has huge potential for intelligent integrated micro devices/systems to provide enhanced performance, increased functionality and reliability with potentially low cost. In this thesis, additive pattern transfer techniques including SU-8 UV-LIGA, PDMS replication, and electroplating-based flip-chip bonding processes were developed. Those developed processes were used to demonstrate the post-IC integration capability of metallic MEMS onto foundry fabricated CMOS chips. LIGA MEMS and MEMS inductors using PDMS electroplating molds were transferred onto CMOS chips. Using multi-layer SU-8 UV-LIGA process, air-suspended MEMS inductors were designed and integrated onto RE circuit chips and such integrated inductors showed excellent RE characteristics. Sub-micron featured metallic comb-drive electrodes were fabricated using EBL-based nanomachining process.
机译:将MEMS集成到微电子学上引起了MEMS研究界的极大兴趣,因为它具有智能集成微器件/系统以潜在的低成本提供增强的性能,增强的功能性和可靠性的巨大潜力。本文研究了包括SU-8 UV-LIGA,PDMS复制和基于电镀的倒装芯片键合工艺在内的附加图案转移技术。这些开发的过程用于证明金属MEMS在铸造制造的CMOS芯片上的后集成电路集成能力。使用PDMS电镀模具的LIGA MEMS和MEMS电感器已转移到CMOS芯片上。使用多层SU-8 UV-LIGA工艺,设计了空气悬浮MEMS电感器,并将其集成到RE电路芯片上,这种集成电感器表现出出色的RE特性。亚微米特征的金属梳状驱动电极是使用基于EBL的纳米加工工艺制造的。

著录项

  • 作者

    Park, Daniel Sang-Won.;

  • 作者单位

    The University of Texas at Dallas.;

  • 授予单位 The University of Texas at Dallas.;
  • 学科 Engineering Electronics and Electrical.
  • 学位 Ph.D.
  • 年度 2004
  • 页码 191 p.
  • 总页数 191
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 无线电电子学、电信技术;
  • 关键词

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