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GaN Growth on Si Using ZnO Buffer Layer

机译:使用ZnO缓冲层在Si上生长GaN

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摘要

ZnO films were deposited by Pulsed Laser Deposition (PLD) onto silicon substrates to serve as a buffer layer for GaN films grown by MOCVD. A ZnO buffer layer was found to improve the quality of GaN grown on Si. The thermal stability of ZnO as a buffer layer was also examined. It was determined that exposure of ZnO/Si to NH_3 at high temperature (> 600 ℃) results in the decomposition of ZnO and subsequent poor nucleation of GaN. The ZnO layer thickness on GaN quality was found to be important.
机译:通过脉冲激光沉积(PLD)将ZnO膜沉积到硅基板上,以用作通过MOCVD生长的GaN膜的缓冲层。发现ZnO缓冲层可以改善在Si上生长的GaN的质量。还检查了作为缓冲层的ZnO的热稳定性。可以确定,在高温(> 600℃)下,ZnO / Si暴露于NH_3会导致ZnO分解并导致随后的GaN成核不良。发现ZnO层厚度对GaN质量很重要。

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