首页> 外文会议>Symposium on New Applications for Wide-Bandgap Semiconductors; 20030422-20030424; San Francisco,CA; US >High-Performance AlGaN-Based Visible-Blind Resonant Cavity Enhanced Schottky Photodiodes
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High-Performance AlGaN-Based Visible-Blind Resonant Cavity Enhanced Schottky Photodiodes

机译:高性能基于AlGaN的可见盲谐振腔增强型肖特基光电二极管

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摘要

We have designed, fabricated and tested resonant cavity enhanced visible-blind AlGaN-based Schottky photodiodes. The bottom mirror of the resonant cavity was formed with a 20 pair AlN/AlGaN Bragg mirror. The devices were fabricated using a microwave compatible fabrication process. Au and indium-tin-oxide (ITO) thin films were used for Schottky contact formation. ITO and Au-Schottky devices exhibited resonant peaks with 0.153 AAV and 0.046 A/W responsivity values at 337 nm and 350 nm respectively. Temporal high-speed measurements at 357 nm resulted in fast pulse responses with pulse widths as short as 77 ps. The fastest UV detector had a 3-dB bandwidth of 780 MHz.
机译:我们已经设计,制造和测试了谐振腔增强型基于可见盲的AlGaN肖特基光电二极管。谐振腔的底部反射镜由20对AlN / AlGaN Bragg反射镜形成。使用微波兼容的制造工艺来制造器件。金和铟锡氧化物(ITO)薄膜用于肖特基接触形成。 ITO和Au-Schottky器件在337 nm和350 nm处分别显示出具有0.153 AAV和0.046 A / W响应度的共振峰。在357 nm处进行时域高速测量可产生快速脉冲响应,脉冲宽度短至77 ps。最快的紫外线检测器具有780 MHz的3 dB带宽。

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