首页> 外文会议>Symposium on New Applications for Wide-Bandgap Semiconductors; 20030422-20030424; San Francisco,CA; US >Solar Blind (Al,Ga)N Metal-Semiconductor-Metal Devices for High Performance Flame Detection
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Solar Blind (Al,Ga)N Metal-Semiconductor-Metal Devices for High Performance Flame Detection

机译:用于高性能火焰检测的日盲(Al,Ga)N金属-半导体金属器件

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In this work we report on solar blind (Al,Ga)N photovoltaic metal-semiconductor-metal (MSM) detectors with a cutoff wavelength as short as ~270 nm. (Al,Ga)N heterostructures, that allow backside illumination, were grown on sapphire substrates by both metalorganic chemical vapor deposition (MOCVD) and molecular beam epitaxy (MBE). We observed that both the interdigitated electrodes and the contact areas contribute to the overall photocurrent. In order to avoid the parasitic current due to the contact pads, we developed a new process where the electrodes are deposited on the (Al,Ga)N surface whereas the contact pads are deposited on an insulator (dielectric) layer besides the electrodes. Some layers develop microcracks related to excess stress. In that case, we showed that both the dark current and the responsivity strongly depend on the crack density. By using our two-level process, we could reduce the parasitic effects of cracks on the dark current. Several dielectrics were tested and our results are reported; values of dark current < 10 fA have been measured at 10 V bias voltage. An extremely high performance can then be reached in these ultraviolet solar blind detectors.
机译:在这项工作中,我们报告了截止波长短至〜270 nm的日光(Al,Ga)N光伏金属-半导体-金属(MSM)检测器。通过金属有机化学气相沉积(MOCVD)和分子束外延(MBE)在蓝宝石衬底上生长允许背面照明的(Al,Ga)N异质结构。我们观察到,叉指电极和接触面积均对总光电流有贡献。为了避免由于接触垫引起的寄生电流,我们开发了一种新工艺,其中将电极沉积在(Al,Ga)N表面上,而将接触垫沉积在除电极之外的绝缘体(电介质)层上。一些层会产生与过度应力有关的微裂纹。在那种情况下,我们表明暗电流和响应度都强烈取决于裂纹密度。通过使用两级过程,我们可以减少裂纹对暗电流的寄生效应。测试了几种电介质,并报告了我们的结果;暗电流<10 fA的值是在10 V偏置电压下测得的。这些紫外线日盲探测器可以达到极高的性能。

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