Thermodynamics properties of simulated electrical trees

摘要

Wiessmann and Zeller [1] (WZ) applied a simple two-dimensional stochastic model in order to apply it to the stepwise propagation of those damage structures known as electrical trees. These branching structures propagate by the repeated extension of the individual tips of damage channels and they had fractal characteristics similar to those observed experimentally in solid dielectrics under alternating voltage excitation. Barclay, Sweeney, Dissado and Stevens [2] (BSDS), explored critically the fractal character of the simulated electrical trees by using the WZ model. In this paper we present a statistical approach that clarifies the selection mechanism that governs the growth of fractal clusters generated by the dielectric breakdown model.