μ-PIXE, UV AND FTIR SPECTROSCOPY STUDIES OF ANTIOXIDANT DEPLETION AT THE XLPE-SEMICON INTERFACES OF HV CABLES

摘要

A systematic study of the depletion of antioxidant in the XLPE insulation adjacent to both the inner and the outer semicon in HV cables by μ-PIXE (Proton Induced X-ray Emission) to measure the distribution of sulphur, UV (at 288 nm) and FTIR (Fourier Transform Infra Red) absorption (at 3530 cm~(-1) and 1735 cm~(-1)) has been made on ribbon and slice samples of HV cables. Significant depletion of the antioxidant, at both the inner and outer interfaces was observed, however, more than simple diffusion is generally required to reconcile the three types of data.