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THE EFFECT OF RADIATION DAMAGE AND HELIUM ON HYDROGEN TRAPPING IN BERYLLIUM

机译:辐射损伤和氦气对铍中氢捕获的影响

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The beryllium is a candidate material for the ITER- first wall. At neutron bombardment radiation defects and helium retention, as a result of nuclear reaction ~9Be(n,2n) --> 2He~4+ 94 keV. will take place. The investigation of radiation defects and helium affect on hydrogen retention in beryllium were carried out. The beryllium samples were irradiated by 2.8 MeV Me ions in Van de Graaf accelerator at the temperature 773 K to simulate neutron irradiation. Helium irradiation fluences were lower than blister formation critical close and were equal 10~(20), 5 centre dot 10~(20) and 10~(21) He~+/m~2. After that 3-keV H~+ ions were implanted into the samples at temperature 573 K. Hydrogen irradiation doses were 5-10~(22)H~+/m~2 and 10~(23) H~+/ m~2. The microstructure of the samples was investigated after He~+ and after He~+ and H~+ irradiation. Depth distribution profiles was measured using the elastic by recoil detection technique. The integral hydrogen concentration in beryllium with He~+ ions induced defects was 2.6-2.8 times large then that in beryllium non-irradiated by He~+ ions. For specimens depth previously irradiated in He~+ ions peak in the hydrogen distribution was at about 0.15 mu m in comparison with 10 the place - 0.03 mu m for specimen implanted only with 3 keV H~+ ions simultaneously. The joint irradiation by He~+ and H~+ ions results in small blisters formation. At maximal He~+ tluence (10~(21) He/m~2) the blister caps are broken, hydrogen releases and integral hydrogen content decreases. The observed effects are explained by vacancies and He atoms diffusion and hydrogen trapping by vacancy-helium traps.
机译:铍是ITER优先壁的候选材料。在中子轰击下,由于核反应〜9Be(n,2n)-> 2He〜4 + 94 keV,导致了辐射缺陷和氦气的滞留。将举行。进行了辐射缺陷和氦气对铍中氢保留的影响的研究。铍样品在Van de Graaf加速器中在773 K的温度下被2.8 MeV Me离子辐照,以模拟中子辐照。氦辐照通量低于气泡形成临界关口,等于10〜(20),5个中心点10〜(20)和10〜(21)He〜+ / m〜2。然后在573 K的温度下将3-keV H〜+离子注入样品中。氢辐照剂量为5-10〜(22)H〜+ / m〜2和10〜(23)H〜+ / m〜2 。在He〜+,He〜+和H〜+辐照后对样品的微观结构进行了研究。通过反冲检测技术使用弹性测量深度分布轮廓。含He〜+离子引起的缺陷的铍中的积分氢浓度是未受He〜+离子辐照的铍中的积分氢浓度的2.6-2.8倍。对于先前在氢分布中的He〜+离子峰中辐照过的样品深度,大约为0.15μm,而在10处,仅同时注入3 keV H〜+离子的样品深度为0.03μm。 He〜+和H〜+离子共同照射导致形成小水泡。在最大He〜+浓度(10〜(21)He / m〜2)时,泡罩破裂,氢释放,整体氢含量降低。空位和氦原子的扩散以及空位氦陷阱的氢俘获可以解释观察到的效应。

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