Demonstration of depth-resolved wavefront sensing using a swept-source coherence-gated Shack-Hartmann wavefront sensor

摘要

In this report we demonstrate results of measuring wavefront aberrations from different depths in a fabricated phantom using a coherence-gated Shack-Hartman wavefront sensing technique (CG-SH/WFS). The SH/WFS is equipped with a Mach-Zehnder interferometer and the coherence gate operates on principles of swept source (SS) interferometry. The CG-SH/WFS is able to differentiate wavefront signals from different depths separated by a depth resolution of 7.1 micron. The CG-SH/WFS delivers a similar SH spot pattern as that provided by a conventional SH/WFS. Due to the coherence gate, the sensor is capable of eliminating stray reflections. Hereby we present the results of measuring depth-resolved wavefront aberrations. The method is robust and all depth-resolved aberrations are recorded simultaneously without any mechanical movement. This technique has the potential of providing depth resolved correction in adaptive optics assisted ophthalmology imaging and in nonlinear microscopy.