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Hafnium Nitride as High Acoustic Impedance Material for Fully Insulating Acoustic Reflectors

机译:氮化作为用于完全绝缘声反射器的高声阻抗材料

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Non-conductive high acoustic impedance materials could provide a simpler solution to some of the challenges that solidly mounted resonators display in biosensing and telecom applications. Hafnium nitride is used as a high acoustic impedance material in fully insulating acoustic reflectors. The HfN thin films display a density close to 11000 kg/m3, which is 80% of the nominal bulk value (13800 kg/m3, and a longitudinal acoustic velocity of 5400 m/s. These values result in a ZA of 59.4 Mrayl, which is considerably higher than that obtained for the most used insulating high acoustic impedance materials (AIN and Ta2O5., 36.3 Mrayl and 38.9 Mrayl respectively) and very close to that of Mo sputtered films (64.7 Mrayl). A five-layer acoustic reflector centered at 3.5 GHz made of HfN/SiO2 is quantitatively compared with a standard Mo/SiO2 reflector. The devices on the HfN/SiO2show a quality factor Q of 750 at the resonant frequency, higher than those fabricated on the Mo/SiO2 reflector that displayed a Q value of 300.
机译:非导电高声阻抗材料可以为在生物传感和电信应用中牢固安装的谐振器显示的一些挑战提供更简单的解决方案。氮化在完全绝缘的声反射器中用作高声阻抗材料。 HfN薄膜的密度接近11000 kg / m 3 ,这是标称体积值(13800千克/平方米)的80% 3 ,并且纵向声速为5400 m / s。这些值导致ZA为59.4 Mrayl,大大高于最常用的绝缘高声阻抗材料(AIN和Ta)获得的ZA。 2 Ø 5 ,分别为36.3 Mrayl和38.9 Mrayl),非常接近Mo溅射膜的薄膜(64.7 Mrayl)。由HfN / SiO制成的中心位于3.5 GHz的五层声反射器 2 与标准Mo / SiO定量比较 2 反射器。 HfN / SiO上的器件 2 在共振频率下的品质因数Q为750,高于在Mo / SiO上制造的品质因数Q 2 反射器显示的Q值为300。

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