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Organic semiconductor rubrene thin films deposited by pulsed laser evaporation of solidified solutions

机译:脉冲激光蒸发固化溶液沉积的有机半导体红荧烯薄膜

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Organic semiconductor rubrene (C_(42)H_(28)) belongs to most preferred spintronic materials because of the high charge carrier mobility up to 40 cm~2(V•s)~(-1). However, the fabrication of a defect-free, polycrystalline rubrene for spintronic applications represents a difficult task. We report preparation and properties of rubrene thin films deposited by pulsed laser evaporation of solidified solutions. Samples of rubrene dissolved in aromatic solvents toluene, xylene, dichloromethane and 1,1-dichloroethane (0.23-1% wt) were cooled to temperatures in the range of 16.5-163 K and served as targets. The target ablation was provided by a pulsed 1064 nm or 266 nm laser. For films of thickness up to 100 nm deposited on Si, glass and ITO glass substrates, the Raman and AFM data show presence of the mixed crystalline and amorphous rubrene phases. Agglomerates of rubrene crystals are revealed by SEM observation too, and presence of oxide/peroxide (C_(42)H_(28)O_2) in the films is concluded from matrix-assisted laser desorption/ionization time-of-flight spectroscopic analysis.
机译:有机半导体红荧烯(C_(42)H_(28))由于最高达40 cm〜2(V•s)〜(-1)的高载流子迁移率而成为最优选的自旋电子材料。但是,为自旋电子学应用制造无缺陷的多晶红荧烯是一项艰巨的任务。我们报告了通过固化溶液的脉冲激光蒸发沉积的红荧烯薄膜的制备和性能。将溶解在芳族溶剂甲苯,二甲苯,二氯甲烷和1,1-二氯乙烷(0.23-1%重量)中的红荧烯样品冷却至16.5-163 K范围内的温度,并用作目标。通过脉冲1064 nm或266 nm激光提供目标消融。对于在Si,玻璃和ITO玻璃衬底上沉积的厚度最大为100 nm的薄膜,拉曼和AFM数据表明存在混合的结晶和非晶红荧烯相。通过SEM观察也可以看到红荧烯晶体的团聚体,并通过基质辅助激光解吸/电离飞行时间光谱分析得出了膜中氧化物/过氧化物(C_(42)H_(28)O_2)的存在。

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