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CONTINUAL AND MOLECULAR DYNAMICS APPROACHES IN DETERMINING THERMAL PROPERTIES OF SILICON

机译:确定硅的热性质的连续和分子动力学方法

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The article discusses the use of mathematical modeling to obtain properties of silicon. The nonequilibrium heating of semiconductor proceeds with a large separation of temperatures of the current carriers from the lattice, therefore, in the problems of laser action a silicon target can be regarded as an object consisting of two interacting subsystems, electron and phonon subsystems. At the same time, for each of subsystems it is necessary to determine thermophysical, optical and thermodynamic characteristics that vary over a wide temperature range. To determine the properties of the electronic subsystem a continual approach was used, and for the phonon subsystem a molecular-dynamic approach was used. Such properties of the electron Fermi gas as electron concentration N_e(T), holes concentration N_h(T), Fermi energy E_F(T), band gap E_g(T,N), carrier mobility μ(T,N), electrical conductivity σ(T,N) are determined within the framework of quantum statistics in an arbitrary degeneracy range when the temperature varies from 300K to 2000K. The most important characteristics of the phonon subsystem such as the pressure dependences of the melting temperature of silicon T_m(P) and the heat of melting L_m(P), and the temperature dependence of the heat of evaporation L_v(T) were determined. The results are compared with the experimental data.
机译:本文讨论了如何使用数学模型来获得硅的特性。半导体的非平衡加热会随着载流子的温度与晶格的大幅度分离而继续进行,因此,在激光作用的问题中,硅靶可以视为由两个相互作用的子系统(电子和声子子系统)组成的物体。同时,对于每个子系统,必须确定在宽温度范围内变化的热物理,光学和热力学特性。为了确定电子子系统的特性,使用了一种连续方法,而对于声子子系统,则使用了一种分子动力学方法。电子费米气体的特性包括电子浓度N_e(T),空穴浓度N_h(T),费米能量E_F(T),带隙E_g(T,N),载流子迁移率μ(T,N),电导率σ (T,N)是在温度从300K到2000K变化时在任意简并范围内在量子统计框架内确定的。确定了声子子系统的最重要特征,例如硅的熔化温度T_m(P)和熔化热L_m(P)的压力依赖性以及蒸发热L_v(T)的温度依赖性。将结果与实验数据进行比较。

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