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15 Mrad ionizing radiation dose effect on GEMINI

机译:15 mrad电离辐射剂量对双子座的剂量效应

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The GEMINI front-end system that will operate at LoKI experiment at ESS is expected to be exposed to radiation for a Total Ionizing Dose (TID) up to 200krad during Triple-GEM detector usage. Analyzing the effect of ionizing radiation on chip gives important information on its robustness, critical for architecture validation. After irradiation with a total dose of 15 Mrad core elements of GEMINI channels still resulted to be functional. This indicates the possibility of using such devices also in other experiments where it would be exposed to higher TID. The test also highlighted few critical points of the architecture that could be starting point to improve Triple-GEM front-end system radiation hardness.
机译:在Triple-Gem检测器使用期间,预计将在ESS的Loki实验中运行的Gemini前端系统将在Triple-Gem检测器使用期间暴露于高达200krad的总电离剂量(TID)。分析电离辐射对芯片的影响为其鲁棒性提供重要信息,对于建筑验证至关重要。在用总剂量的16个MRAD核心元素照射后,双子​​座渠道仍然是功能性的。这表明也可以在其他实验中使用这种设备的可能性,其中它将暴露于更高的TID。该测试还强调了架构的一些关键点,可以是提高三宝石前端系统辐射硬度的起点。

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