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Cryo-cathodoluminescence study of Cu2ZnSnS4 thin films

机译:Cu2ZnSnS4薄膜的低温阴极发光研究

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Cryo-cathodoluminescence was used to investigate defects present in CuZnSnS thin films. Four luminescence peaks of energies P1: 0.90 eV, P2: 1.04 eV, P3: 1.18 eV, and P4: 1.29 eV were investigated in detail and a fifth peak at ~1.6 eV was also noted. Based on a power-series analysis, P1, P2, and P3 are attributed to free-to-bound or donor-acceptor-pair transitions while P4 appears excitonic in nature. This spectral decomposition in energy became more apparent at large current densities. The observed peaks were attributed to specific recombination mechanisms to inform future studies.
机译:低温阴极发光用于研究CuZnSnS薄膜中存在的缺陷。详细研究了能量P1:0.90 eV,P2:1.04 eV,P3:1.18 eV和P4:1.29 eV的四个发光峰,还注意到了在〜1.6 eV处的第五个发光峰。根据幂级数分析,P1,P2和P3归因于自由结合或供体-受体对的跃迁,而P4本质上表现为激子。在大电流密度下,这种能量的频谱分解变得更加明显。观察到的峰归因于特定的重组机制,可为将来的研究提供参考。

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