Optical characterization of fullerite C_60 thin films

摘要

Transmission and reflectance spectra of fullerite C_60 thin films deposited on quartz and Si substrates are presented. An Urbach tail of states is presnet below the absorption edge due to the disordered structure of films. Photoluminescence (PL) spectra have been measured from 10 to 300 K. The recombination line of a self-trapped exciton polaron and its phonon relicas are presnet in the PL spectra.