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Electrial conductivity and oxygen doping of vapour-deposited oligothiophene films

机译:蒸镀低聚噻吩薄膜的电导率和氧掺杂

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We have measured current-voltage (I-V) characteristics of vapour-deposited films of various oligothiophenes in the direction parallel to the substrate using a two-point probe technique with symmetric contacts. For applied field strengths up to 2 X 10~4 V cm~(-1), the I-V characteristics are linear. The conductiviyt (sigma) of freshly prepared films is very low (below 10~(-11) S cm~(-1) for EC6T, an oligothiophene with end-substituted 4,5,6,7-tetrahydrobenzo groups ('end caps') and with six thiophene units), but can be increased by four orders of magnitude on doping with oxygen (sigma=4X10~(-7) S cm~(-1)), the doping process being strongly promoted by light and/or applied current. Using capacitance-voltage (C-V) spectroscopy a charge carrier density of 10~(17)cm~(-3) was measured. The temperature dependence of sigma (140-320 K) can best be fitted by an exponential law (exp(alphaT)).
机译:我们已经使用对称接触的两点探针技术在平行于基板的方向上测量了各种低聚噻吩的气相沉积膜的电流-电压(I-V)特性。对于高达2 X 10〜4 V cm〜(-1)的施加场强,IV特性是线性的。新鲜制备的薄膜的电导率(sigma)非常低(对于EC6T是10-(-11)S cm-(-1)以下的有机碳,这是一种末端被取代的4,5,6,7-四氢苯并基的低聚噻吩('端帽')和六个噻吩单元),但是在掺入氧气(σ= 4X10〜(-7)S cm〜(-1))时可以增加四个数量级,光和/强烈促进了掺杂过程或施加的电流。使用电容-电压(C-V)光谱仪,测得的载流子密度为10〜(17)cm〜(-3)。 σ(140-320 K)对温度的依赖性最好通过指数定律(exp(alphaT))来拟合。

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