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Spindt tip aging: understanding the behavior of single tips and groups of tips

机译:Spindt笔尖老化:了解单个笔尖和笔尖组的行为

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The physical mechanisms responsible for emitter aging in field emission displays are difficult to elucidate from typical device lifetests. We examined the field emission physics of single Spindt tips in a special device structure. Our findings indicate that individual tips emit from multiple nano-scale features with fluctuating current levels. We developed a "burn-in" procedure and characterized several aging mechanisms.
机译:很难从典型的设备寿命测试中阐明造成场发射显示器中发射极老化的物理机制。我们在特殊的设备结构中检查了单个Spindt尖端的场发射物理学。我们的发现表明,各个尖端从电流水平波动的多个纳米尺度特征中发出。我们开发了一种“老化”程序,并描述了几种老化机制。

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