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A NEW NDIR ANALYZER INCORPORATING A COMPLETE SYSTEM CALIBRATION

机译:包含完整系统校准的新型NDIR分析仪

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A double pass in-situ NDIR analyzer has been developed utilizing the incremental addition of two or more different and known calibration standards. This automatically calibrates the complete system in the presence of sample. Potential interferences and alignment variations are detected and eliminated. This calibration takes only a few seconds and can be performed on a minute by minute basis if desired. The periodic internal instrument zero, span, and reference standards validation frequency is operator selectable, and only requires the analyzer to be off-line momentarily. This calibration scheme assures continuous zero and span stability, and requires no operator assistance.
机译:利用两个或多个不同且已知的校准标准品的增量相加,开发了一种双程原位NDIR分析仪。这会在样品存在时自动校准整个系统。检测并消除潜在的干扰和对齐变化。该校准仅需几秒钟,并且可以根据需要每分钟进行一次。定期的内部仪器调零,量程和参考标准验证频率是操作员可以选择的,并且只需要分析仪暂时脱机即可。该校准方案可确保连续的零位和跨度稳定性,并且不需要操作员的协助。

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