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Fabrication and Magnetic Properties of CoNiAl Ferromagnetic Shape memory Alloy thin films

机译:CoNiAl铁磁形状记忆合金薄膜的制备及磁性

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Study o Ferromagnetic shape memory alloys (FSMAs) is an interesting topic of present day research because of their large magnetic field induced shape recovery. They are important materials for the development of sensors and actuator based applications. Attempt for miniaturization of these actuators and sensors have led to the study of thin films. Bulk CoNiAl alloys are promising FSMAs because of their higher ductility and large range of control over the magnetic and structural transformation temperatures. To investigate the physical properties in thin film form we fabricated CoNiAl alloy films by D.C. sputtering method on glass substrates (kept at room temperature) under various conditions. They were annealed in vacuum at 500 ℃ for 1h. The samples were characterized by X-ray diffraction, scanning electron microscopy, energy dispersive X-ray analysis and ellipsometry. Thickness of the films was found to be lying between 70 and 272 nm. Fine grained microstructure was found for all the deposited films. The transformation temperatures of the samples were taken from the resistivity measurement done between 80 and 350 K. Magnetization measurements were also done between 80 and 400 K by using a vibrating sample magnetometer, but the Curie temperatures of the present films were not found to be below 400 K and magnetoelastic couplings were found to be rather weak.
机译:铁磁形状记忆合金(FSMAs)的研究是当今研究中一个有趣的话题,因为它们的磁场引起的形状恢复很大。它们是开发基于传感器和执行器的应用程序的重要材料。这些致动器和传感器的小型化尝试导致了薄膜的研究。块状CoNiAl合金具有较高的延展性以及对磁性和结构转变温度的较大控制范围,因此有望成为FSMA。为了研究薄膜形式的物理性能,我们通过DC溅射法在各种条件下在玻璃基板上(室温保存)制备了CoNiAl合金膜。将它们在500℃的真空中退火1小时。通过X射线衍射,扫描电子显微镜,能量色散X射线分析和椭圆光度法对样品进行表征。发现膜的厚度在70至272nm之间。发现所有沉积膜的细晶粒组织。样品的转变温度是从80到350 K之间的电阻率测量中获得的。磁化强度的测量也是通过使用振动的样品磁力计在80到400 K之间进行的,但是发现本膜的居里温度没有低于此温度。发现400 K和磁弹性耦合非常弱。

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