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FEA evaluation on solder joint reliability of CCGA

机译:CCGA焊点可靠性的FEA评估

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摘要

3D diagonal sliced models for seven combinations of CCGA package s were built. The FEA results show that, the board level reliability of Package A with interposer is more than two times better than Package B without interposer. But the improvement should be mainly attributed to the bigger and longer columns used by Package A, instead of the interposer. Bigger and longer column and thicker eutectic joint improve the reliability significantly.
机译:建立了CCGA封装的七个组合的3D对角切片模型。 FEA结果表明,带有中介层的封装A的板级可靠性比没有中介层的封装B的板级可靠性高两倍以上。但是,这种改进应主要归因于Package A使用的更大和更长的列,而不是插入器。更大更长的柱子和更厚的共晶接头可以显着提高可靠性。

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