Long-term Reliability of High Power Single Mode 980 nm Pump Laser Diodes

摘要

The long-term reliability of high-power, single-mode, 980 nm, InGaAs/GaAlAs/GaAs, laser diodes is reported. . We have performed constant-current aging at at 85℃ for three operating currents, 450 mA (～300 mW), 550 mA (～350 mW) and 700 mA (～420 mW). The data for 450 mA aging indicate a total failure rate of less than 250 FITs at a confidence level of 60%. For 550 mA and 700 mA operating currents, no degradation in laser performance within the 5% measurement accuracy of our test equipment have been observed during the first thousand hours of testing.