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The manufacture of the nano V1-x-y WxSiyO22 thin films for the uncooled IR detectors by the sol-gel method

机译:纳米V 1-xy W x Si y O 2 2薄膜的制备溶胶-凝胶法检测

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Thermochromic properties of vanadium dioxide thin films are applied to bolometer materials for the uncooled microbolometer due to their high temperature coefficient of resistance (TCR) at room temperature. In this paper sol-gel method was used to manufacture the V 1-x -yWxSiyO2 thin films and the quantities of the tungsten- and SiO2-doped VO2 thin films were determined by the design of experiments. V1-x -y WxSiyO2 thin films were deposited on a non-alkali glass substrate by the spin coating process. Then the thin films were calcined at 500degC under a reducing gas flow (H2 -Ar, 5%-95%) in an atmospheric control furnace. The chemical stoichiometry of the films was characterized by the ESCA. AFM and XRD measurements were performed to study the surface morphology and the crystallinity. In addition, the optical and electrical properties of the thin films were measured by FTIR, UV-Vis Spectrometer, Ellipsometry and High Resistance Meter
机译:由于二氧化钒薄膜的热致变色特性在室温下具有较高的电阻温度系数(TCR),因此可将其应用于未冷却的微辐射热测量仪的辐射热测量材料。本文采用溶胶-凝胶法制备了V 1-x -y W x Si y O 2 sub>薄膜以及掺钨和SiO 2 的VO 2 薄膜的数量。将V 1-x -y W x Si y O 2 薄膜沉积在无碱玻璃上基板通过旋涂工艺。然后在大气控制炉中在还原气流(H 2 -Ar,5%-95%)下于500℃煅烧薄膜。膜的化学计量由ESCA表征。进行AFM和XRD测量以研究表面形态和结晶度。另外,通过FTIR,UV-Vis光谱仪,椭偏仪和高电阻仪测量薄膜的光学和电学性质。

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