首页> 外文会议>1st International Conference on Component Optimisation, 1st, Mar 29 - Apr 1, 1999, University of Wales, Swansea, United Kingdom >DIRECT CURRENT POTENTIAL DROP CALIBRATION OF CRACK GROWTH CURVES IN A DOUBLE EDGED NOTCHED SPECIMEN
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DIRECT CURRENT POTENTIAL DROP CALIBRATION OF CRACK GROWTH CURVES IN A DOUBLE EDGED NOTCHED SPECIMEN

机译:双刃缺口试样中裂纹生长曲线的直接电流势下降标定

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This paper presents the direct current potential drop crack growth resistance curves for a double-edged notch specimen. The results were derived using a three-dimensional finite element heat conduction package, since the differential equation for heat conduction and direct current potential drop are the same. The finite element program was verified using, several simple heat conduction examples. A further benchmark used was the analytical solution for the potential drop around a quarter circular defect in a cube. Quarter circular and quarter elliptical cracks were modelled in the double-edged notch specimen. The quarter elliptical cracks had a maximum aspect ratio of 1.88, and were based on fatigue cracks in the D.E.N. specimen. It was found that the resistance curves are linear when the P.D. signal is measured at the optimum probe wire position, and is plotted against crack length along the plain surface. It was also established that the P.D. versus crack area relationship at the optimum probe position is independent of crack shape
机译:本文介绍了双刃口试样的直流电势下降裂纹扩展阻力曲线。结果是使用三维有限元导热封装得出的,因为导热和直流电势差的微分方程是相同的。使用几个简单的热传导示例验证了有限元程序。使用的另一个基准是分析方法,用于解决立方体中四分之一圆形缺陷附近的电位下降。在双刃缺口试样中模拟了四分之一圆形和四分之一椭圆形裂纹。四分之一椭圆形裂纹的最大长径比为1.88,并且基于D.E.N.中的疲劳裂纹。样品。发现当P.D.时电阻曲线是线性的。在最佳探针线位置测量信号,并相对于沿平整表面的裂纹长度作图。还确定了P.D.最佳探针位置处的裂纹对面积关系与裂纹形状无关

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